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Home > Research > Microstructural and Surface Analysis Characterization > Surface Analysis
Methods: Auger electron spectroscopy (AES), X-Ray photoelectron spectroscopy (XPS, ESCA), Secondary Ion Mass-spectroscopy (SIMS), Plasmon losses spectroscopy, High resolution electron energy losses spectroscopy (HREELS), Analysis of the atomic structure of the surface (EELFS)
1. Auger electron spectroscopy (AES)
2.Secondary Ion Mass-spectroscopy (SIMS)
3. X-Ray photoelectron spectroscopy (XPS, ESCA)
Plasmon losses spectroscopy, High resolution electron energy losses spectroscopy (HREELS), Analysis of the atomic structure of the surface (EELFS) are the specific scientists investigations and their prices will be estimated in dependence of aims of investigations
4. Differential Thermal Analysis
A small samples (~ 1 g) from -196 to 1600 degress Celcius on air, in argon protective atmosphere or in vacuum ten to the negative one Pa.
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